Home > Scanning Microscope >

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode

Product Categories

Compound Optical Microscope [125]
Stereo Optical Microscope [158]
Digital Optical Microscope [82]
Digital LCD Microscope [55]
Biological Microscope [139]
Metallurgical Optical Microscope [134]
Scanning Microscope [26]
Inverted Optical Microscope [55]
Polarizing Light Microscope [64]
Fluorescence Microscope [91]
Multi Viewing Microscope [19]
Forensic Comparison Microscope [45]
Phase Contrast Microscope [22]
Jewelry Microscope [37]
Microscope Accessories [189]
Astronomical Refracting Telescope [4]
Surgical Operating Microscope [33]
Motorized Microscope [8]

Opto-Edu (Beijing) Co., Ltd.

Trust Seal

Verified Supplier

Credit Check

Supplier Assessment

Contact Now

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode

Name: Opto Edu A614510 Scanning Tunneling Electron Microscope Constant Height Current Mode
Brand: OPTO-EDU
Price: 1 USD

Brand Name : OPTO-EDU

Model Number : A61.4510

Certification : CE, Rohs

Place of Origin : China

MOQ : 1pc

Price : FOB $1~1000, Depend on Order Quantity

Payment Terms : L/C, Western Union, T/T, MoneyGram

Supply Ability : 5000 pcs/ Month

Delivery Time : 5~20 Days

Packaging Details : Carton Packing, For Export Transportation

Work Mode : "Constant Height Mode Constant Current Mode"

Current Spectrum Curve : " I-V Curve Current-Distance Curve"

XY Scan Range : 5×5um

XY Scan Resolution : 0.05nm

Z Scan Range : 1um

Y Scan Resolution : 0.01nm

Scan Speed : 0.1Hz~62Hz

Scan Angle : 0~360°

Sample Size : "Φ≤68mm H≤20mm "

XY Stage Moving : 15×15mm

Shock-Absorbing Design : Spring Suspension

Optical Syestem : 1~500x Continous Zoom

Output : USB2.0/3.0

Software : Win XP/7/8/10

Contact Now

Scanning Tunneling Microscope

Miniaturized and detachable design, very easy to carry and classroom teaching
The detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
Side CCD observation system, real-time observation of probe needle insertion status and positioning of probe sample scanning area
Spring suspension shockproof method, simple and practical, good shockproof effect

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode

◆ Miniaturized and detachable design, very easy to carry and classroom teaching

◆ The detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

◆ Side CCD observation system, real-time observation of the probe needle insertion state and positioning of the probe sample scanning area

◆ Spring suspension shockproof method, simple and practical, good shockproof effect

◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

Opto Edu A61.4510 Scanning Tunneling Electron Microscope Constant Height Current Mode

A61.4510
Work Mode	Constant Height Mode Constant Current Mode
Current Spectrum Curve	I-V Curve Current-Distance Curve
XY Scan Range	5×5um
XY Scan Resolution	0.05nm
Z Scan Range	1um
Y Scan Resolution	0.01nm
Scan Speed	0.1Hz~62Hz
Scan Angle	0~360°
Sample Size	Φ≤68mm H≤20mm
XY Stage Moving	15×15mm
Shock-Absorbing Design	Spring Suspension
Optical Syestem	1~500x Continous Zoom
Output	USB2.0/3.0
Software	Win XP/7/8/10

Microscope	Optical Microscope	Electron Microscope	Scanning Probe Microscope
Max Resolution (um)	0.18	0.00011	0.00008
Remark	Oil immersion 1500x	Imaging diamond carbon atoms	Imaging high-order graphitic carbon atoms
Remark

Probe-Sample Interaction	Measure Signal	Information
Force	Electrostatic Force	Shape
Tunnel Current	Current	Shape, Conductivity
Magnetic Force	Phase	Magnetic Structure
Electrostatic Force	Phase	charge distribution

	Resolution	Working Condition	Working Temperation	Damge to Sample	Inspection Depth
SPM	Atom Level 0.1nm	Normal, Liquid, Vacuum	Room or Low Temperation	None	1~2 Atom Level
TEM	Point 0.3~0.5nm Lattice 0.1~0.2nm	High Vaccum	Room Temperation	Small	Usually <100nm
SEM	6-10nm	High Vaccum	Room Temperation	Small	10mm @10x 1um @10000x
FIM	Atom Level 0.1nm	Super High Vaccum	30~80K	Damge	Atom Thickness

Product Tags: